Peer Review History: PCB Defect Detection Based on Improved YOLOv8

Editor(s):

(1) Dr. Dariusz Jacek Jakobczak, Technical University of Koszalin, Poland.

Reviewers:

(1) Prakash Kerur, K L E Institute of Technology, India.

(2) Kant E Venkatadurgaprasad, Pragati Engineering College (A), INDIA.

(3) Vivek Ghulaxe, USA.

Additional Reviewers:

(1) Daniel Uchenna Achilihu, Afe Babalola University, Nigeria.

(2) Kaustubh Kumar Shukla, Dronacharya Group of Institutions, India.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 8.06/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (Prakash Kerur, India) | File 1 | NA


Stage 2 | Peer Review Report_2 (Kant E Venkatadurgaprasad, INDIA) | File 1 | NA


Stage 2 | Peer Review Report_3 (Vivek Ghulaxe, USA) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.