Editor(s):
(1) Dr. Palle Jorgensen, University of Iowa, USA.
Reviewers:
(1) Sathish Krishna Anumula, USA.
(2) Subhanshu Pratap Singh, Noida International University, India.
(3) Karthik Sirigiri, RedMane Technology LLC, United States of America.
(4) Santosh Kumar Vududala, Congizant, USA.
Additional Reviewers:
(1) Prithviraj R, Vel Tech Rangarajan Dr.Sagunthala R&D Institute of Science and Technology, India.
(2) Sameena Begam Savukath Ali, United States.
Open Peer Review Policy: Click Here
Specific Comment:
Average Peer review marks at initial stage: 8.5/10
Average Peer review marks at publication stage: 9/10
Peer Review History:
Stage 1 | Original Manuscript | File 1 | NA
Stage 2 | Peer Review Report_1 (Sathish Krishna Anumula, USA) | File 1 | NA
Stage 2 | Peer Review Report_2 (Subhanshu Pratap Singh, India) | File 1 | NA
Stage 2 | Peer Review Report_3 (Karthik Sirigiri, United States of America) | File 1 | NA
Stage 2 | Peer Review Report_4 (Santosh Kumar Vududala, USA) | File 1 | NA
Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2
Stage 3 | Comment_Editor_1_v1 | File 1 | NA